@article {,
	title = {Materials fingerprinting classification},
	journal = {Computer Physics Communications},
	year = {2021},
	month = {Jan-05-2021},
	pages = {108019},
	abstract = {Significant progress in many classes of materials could be made with the availability of experimentally-derived large datasets composed of atomic identities and three-dimensional coordinates. Methods for visualizing the local atomic structure, such as atom probe tomography (APT), which routinely generate datasets comprised of millions of atoms, are an important step in realizing this goal. However, state-of-the-art APT instruments generate noisy and sparse datasets that provide information about elemental type, but obscure atomic structures, thus limiting their subsequent value for materials discovery. The application of a materials fingerprinting process, a machine learning algorithm coupled with topological data analysis, provides an avenue by which here-to-fore unprecedented structural information can be extracted from an APT dataset. As a proof of concept, the material fingerprint is applied to high-entropy alloy APT datasets containing body-centered cubic (BCC) and face-centered cubic (FCC) crystal structures. A local atomic configuration centered on an arbitrary atom is assigned a topological descriptor, with which it can be characterized as a BCC or FCC lattice with near perfect accuracy, despite the inherent noise in the dataset. This successful identification of a fingerprint is a crucial first step in the development of algorithms which can extract more nuanced information, such as chemical ordering, from existing datasets of complex materials.},
	keywords = {Atom probe tomography, High entropy alloy, Machine Learning, Materials discovery, Topological data analysis},
	issn = {00104655},
	doi = {10.1016/j.cpc.2021.108019},
	url = {https://linkinghub.elsevier.com/retrieve/pii/S0010465521001314},
	author = {Spannaus, Adam and Law, Kody J.H. and Piotr Luszczek and Nasrin, Farzana and Micucci, Cassie Putman and Liaw, Peter K. and Santodonato, Louis J. and Keffer, David J. and Maroulas, Vasileios}
}
